Experience PI’s Precision Motion Control Solutions for Wafer Stages, Metrology, and Beam Control at Booth 1554 in Phoenix, AZ
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Events - PI (Physik Instrumente) L.P.

Experience PI’s Precision Motion Control Solutions for Wafer Stages, Metrology, and Beam Control at Booth 1554 in Phoenix, AZ

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Nanopositioning solutions for semiconductor test and metrology. 

Phoenix, AZ, Oct 7, 2025 - at SEMICON West 2025 / booth #1554, PI will present its newest high-precision motion control technologies for semiconductor test, metrology, and manufacturing.

Featured demonstrations include:

  • Multi-axis wafer stages for film metrology and wafer inspection
  • Piezo-driven platforms for nanometer-level positioning
  • Air-bearing stages designed for wafer metrology and stealth dicing
  • Miniature piezo stages and vacuum-compatible motorized stages
  • Silicon photonics alignment systems
  • 6DOF MagLev positioning solutions with picometer resolution
  • Fast nano-focus stages with both piezo and voice-coil actuation options

PI’s broad portfolio supports critical semiconductor processes such as nano-lithography, mask and CD measurement, wafer inspection, and wafer dicing. Beyond semiconductors, PI solutions accelerate advances in silicon photonics, quantum computing, industrial automation, high-resolution microscopy, and life sciences—reinforcing the company’s role as a global enabler of next-generation technologies.

Can’t attend SEMICON West 2025 in Phoenix? Explore PI’s motion control solutions for semiconductor test and manufacturing anytime online.

Physik Instrumente – Wafer Inspection

Wafer Inspection & Metrology

The entire chip manufacturing process consists of 400 to 800 production steps. At all critical points in the manufacturing process, inspection processes are essential to ensure the high quality and reliability of the final products.

Wafer Inspection & Metrology

Efficient wafer inspection and metrology are essential in semiconductor manufacturing to prevent yield loss. Achieving this requires precise wafer positioning, which enables fast and reliable analysis of defects and particles at every production stage.

Physik Instrumente Metro Demonstrator Superior

Wafer Inspection & Metrology

Efficient wafer inspection and metrology are essential for ensuring a stable, high-performance semiconductor manufacturing process. With up to 800 complex production steps, semiconductor fabrication demands precise inspection and metrology at every critical stage to guarantee the highest levels of quality and yield.

Solutions for Semiconductor Manufacturing

Physik Instrumente Wafer Inspection

Wafer Stealth Dicing

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