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L-220 V6 High-Resolution Linear Actuator Suitable for Vacuum

Suitable for High Cycle Numbers

L-220 V6 High-Resolution Linear Actuator Suitable for Vacuum
Product Description Specifications Downloads Quote / Order

Reference-class linear drive

Combines high precision, high forces, and high dynamics. High-performance and low-vibration 2-phase stepper motor with gear ratio allows precision positioning even without position control.

High-quality components

Ball screw for smooth feed. Nonrotating tip for uniform motion prevents wobble, torque, and wear at the point of contact. Incl. flat and spherical tip for decoupling forces. Noncontact limit switches protect the mechanics. A direction-sensing reference switch supports automation applications.

Reduced outgassing especially for use in vacuum environments

Most notably, for the lubrication of the guides and the drive screw a material with particularly low outgassing is used. Therefore, a bakeout temperature of up to 80 °C can be reached. With this and other modifications of the PI V6 vacuum class, this positioner can be used up to 10-6 hPa.

Application fields

Vacuum chambers. Research. Beamline instrumentation. Microscopy. Electronics assembly and inspection.

Specifications

Datasheet

Datasheet L-220 V

Version / Date
2020-04-23
Version / Date
2020-04-23
Document language
pdf - 270 KB
pdf - 272 KB

Downloads

Datasheet

Datasheet

Datasheet L-220 V

Version / Date
2020-04-23
Version / Date
2020-04-23
Document language
pdf - 270 KB
pdf - 272 KB

Documentation

Documentation

User Manual L220T0020

L-220.02A200V6 Precision linear actuator with stepper drive and gear for vacuum applications (1 E-6 hPa)
Version / Date
2020-06-26
Document language English
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3-D Models

3-D Models

3-D model L-220.02A200V6

Version / Date
2020-04-24
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Quote / Order

Ask for a free quote on quantities required, prices, and lead times or describe your desired modification. All products available online can be ordered directly.

Applications

IsoView Light Sheet Microscope

Light Sheet Microscopy is a fascinating technology with a huge application potential in life sciences and biotechnology. IsoView is a brilliant interpretation of this technology, especially intended for imaging fast cellular dynamics across large specimens over several hours. Specimen positioning and objective translation plays a major role in the design of IsoView.
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Flamingo Lightsheet Fluorescence Microscopy

Light Sheet Fluorescence Microscopy (LSFM), also called Single Plane Illumination Microscopy (SPIM ) is a very powerful microscopy technology for gentle in vivo imaging offering low phototoxicity and fast image acquisition.
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Positioning Solutions for Total Internal Reflection Fluorescence Microscopy (TIRFM)

Linear stages adjust the laser beam in the TIRF microscope. Precision positioning of the sample is possible by combining two XY stages.
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system for beam preparation

Multi-Axis Beam Preparation


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DESY-XYZ-Stage-Granite

X-Ray Scanning Microscope

The Hard X-ray Micro/Nano-Probe beamline P06 at PETRA III provides advanced visualisation with micro/nanoscopic spatial resolution using different X-ray techniques.
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PI-X-Ray-Transmission-Microscope

Soft X-Ray Transmission

The Beamline 6.1.2 (XM-1) at Advanced Light Source (ALS), Berkeley, is dedicated to X-ray microscopy and research on nanoscale magnetism.
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PI-Tomography-Stage

Cryogenic Samples

The setup of the x-ray tomography stage, located at the P06 beamline of PETRA III at DESY (Germany) allows to investigate samples that require both cooling and vacuum environment.
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Diamond-Light-Source-Beamline-I07

Sample Adjustment

At Diamond Light Source, UK, beamline I07 is a high-resolution X-ray diffraction beamline dedicated to investigate the structure of surfaces and interfaces.
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Positioning for Micro-CT

The BAMline is intended for X-ray fluorescence analysis, micro-computed tomography, X-ray topography, detector calibration and reflectometry.
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SSRF-Photon-Delivery-System

Slit Control

XZ positioning systems control x-xay slits at the the Shanghai Synchrotron Radiation Facility, Shanghai (SSRF).
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PI-4-Axis-Positioning

Long-Term Positioning

High-Precision at 10-7 hPa, beamline experiments at the Swiss Light Source (SLS).
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SURFACE Sample Manipulator

High Vacuum Positioning

Investigation of the structural properties of thin films under high-vacuum conditions.
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PI-Vacuum-Chamber-PI-Hexapod

Vacuum Chamber

Positioning the Vacuum Chamber for X-ray Diffraction Experiment
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Cryo Sample Positioning with SpaceFAB

Sample Positioning in High-Vacuum

Sample Manipulators in High-Vacuum
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Positioning for Laminography

High-Precision Spatial Positioning of Flat, Extended Objects
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Light Microscope

Light Microscope

A fluorescence light microscope has been developed that allows non-destructive analysis of tiniest samples.
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Tomography and Holography

Tomography and Holography

Sample positioning setup inside tomography and holography endstations.
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Optics Hutch Instrumentation

Optics Hutch Instrumentation

At DESY in Hamburg, the P05 Imaging Beamline is operated by the HZG.
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Accelerator Technology

Dynamic compensation of Lorentz forces at the XFEL accelerator structures: The particle accelerator XFEL at the DESY (German Electron Synchrotron) uses acceleration technology based on super-conducting acceleration structures, so-called resonators or cavities.
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Positioning of X-Ray Detectors

Positioning of X-Ray Detectors

The LCLS produces synchrotron radiation of extremely high brilliance.
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Nanotomography sample positioning

Nanotomography

At the X-ray light source PETRA III at the DESY research center in Hamburg operates the Imaging Beamline P05.
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Beamline Instrumentation

Beamline Instrumentation

Scientific experiments pose their own challenges, and beamline X-ray experiments are even more special in themselves. However, the need for precision equipment is universal.
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High-Speed Microscopy for Quality Control

High-Speed Microscopy

Specimen positioning on AFM scanners for atomic force microscopy is performed with piezo-based scanning stages which thus play a key role.
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Microscopy

Imaging processes increase efficiency across a number of fields, ranging from medical engineering to pharmaceutical research and manufacturing of semiconductors.
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Confocal Microscopy

Confocal microscopy is used to detect the structure of the sample surface through the shifting of the focal plane, for example in dermatology.
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High-Resolution, Three-Dimensional Surface Inspection

White Light Interferometry

High-resolution camera systems are combined with white light interferometry for 3-D surface inspection with picometer resolution.
Lens Positioning for 3-D Surface Inspection
Atomic Force Microscopy

Atomic Force Microscopy

Specimen positioning on AFM scanners for atomic force microscopy is performed with piezo-based scanning stages which thus play a key role.
Scanning Tables for Atomic Force Microscopy