Shortly after introducing a novel voice-coil motor driven objective Z-focusing stage for auto-focus applications with travel ranges to 7mm, PI now adds a new generation of piezo Z-focus stages for surface metrology and microscopy. The new P-725 PIFOC® piezo focus family is available in 3 travel ranges, 100µm, 400µm and an industry leading 800µm. High performance focusing with nanometer precision is an enabling technology in applications such as super resolution microscopy, wafer metrology, digital pathology and laser material processing. The advanced design makes it possible to provide 800µm travel while maintaining excellent dynamic properties and accuracy.
PI’s redesigned focus stages are easier to install, more compact, allowing for multiple units on one microscope turret, and most of all provide higher dynamics, resolution and travel ranges. Equipped with capacitive direct feedback and the award winning, MARS-rover tested PICMA® high-performance piezoelectric actuators the new P-725 nanopositioning stage family also features an improved, and stiffer motion amplifier and flexure guiding system that provides the basis for industry leading step and settle times.